By Dirk Beyer, Andreas Stahlbauer (auth.), Antonín Kučera, Thomas A. Henzinger, Jaroslav Nešetřil, Tomáš Vojnar, David Antoš (eds.)
This quantity includes the post-proceedings of the eighth Doctoral Workshop on Mathematical and Engineering tools in computing device technology, MEMICS 2012, held in Znojmo, Czech Republic, in October, 2012. The thirteen completely revised papers have been conscientiously chosen out of 31 submissions and are awarded including 6 invited papers. the subjects coated by means of the papers comprise: computer-aided research and verification, functions of online game thought in laptop technology, networks and safeguard, glossy traits of graph conception in laptop technological know-how, digital platforms layout and checking out, and quantum details processing.
Read or Download Mathematical and Engineering Methods in Computer Science: 8th International Doctoral Workshop, MEMICS 2012, Znojmo, Czech Republic, October 25-28, 2012, Revised Selected Papers PDF
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Extra info for Mathematical and Engineering Methods in Computer Science: 8th International Doctoral Workshop, MEMICS 2012, Znojmo, Czech Republic, October 25-28, 2012, Revised Selected Papers
Gravier et al. – [κ(G) ≤ max(n − p, n − q)]: Any set B such that |B| > max(n − p, n − q) contains at least one vertex from each MIS and moreover it contains a MIS S of size q. Let D ⊆ B \ S be a clique of size q − 1 = 1 mod 2. Every vertex u in V \ B is connected to all the vertices in D but one, so Odd(D) ⊆ B. – [κ (G) ≤ p + q − 1]: Let S be an MIS. Let B be the union of S and of a clique of size q. Let D = B \ S. |D| = q − 1 = 1 mod 2. Every vertex u in V \ B is connected to all the vertices of D but one, so Odd(D) ⊆ B.
811n with high probability. First we prove the following lemma: Lemma 4. Given k and G = (V, E), if for any non empty set D ⊆ V , |D ∪ Odd(D)| > n − k and |D ∪ (V \ Odd(D))| > n − k then κQ (G) < k. Proof. Since ∀D ⊆ V |D∪Odd(D)| > n−k, κ (G) > n−k. Let B ⊆ V , |B| ≥ k, if B is not WOD then ∃C ⊆ V \B such that B ⊆ Odd(C), so (V \Odd(C)) ⊆ V \B which implies |C ∪ (V \ Odd(C))| ≤ n − k. ✷ We use the asymmetric form of the Lov´asz Local Lemma that can be stated as follows: Theorem 2 (Asymmetric Lov´ asz Local Lemma, no independency case).
Testing Embedded Memories: A Survey 3 35 Test Algorithm Design Tests and fault detection for semiconductor memories have experienced a long evolutionary process, starting before 1980’s. Overall, memory test algorithms can be classiﬁed into three classes: (a) Ad-hoc tests, (b) March tests, and (b) Fault primitive based tests; they are explained next. Ad-hoc Tests: The are the early tests (typically before the 1980’s). They are classiﬁed as Ad-Hoc because of the absence of formal fault models and proofs.